Our vision is to transform how the world uses information to enrich life for all.
Micron Technology is a world leader in innovating memory and storage solutions that accelerate the transformation of information into intelligence, inspiring the world to learn, communicate and advance faster than ever.
JR46485 F11 Metrology Application Engineer As a Metrology Application Engineer at Micron , you will learn how to use innovative Metrology recipe and equipment to solve issues. The goal of this position is to accelerate cycles of learning and technology transfer in Technology Development. We need engineers who are passionate about problem-solving and eager to make changes for the better.
We will provide you with the opportunity to develop critical thinking and problem-solving skills to achieve Metrology beneficial applications. In learning to identify and solve process issues, you will improve and optimize reliability of Metro's operations. You will have the ability to impact the team globally. Through this, you will be responsible to support experimentation, data analysis, baseline health metrics, and detailed and process improvement through partnering with others in Technical Development and High-Volume Manufacturing.
Responsibilities/Tasks include but are not limited to:
Develop, analyze and implement metrology measurement techniques in Photo Lithography or Film Metrology, including Overlay, CD-SEM, OCD scatterometry, X-ray and surface analysis platforms.
Perform SWR (Special Work Request) and conversion plan to validate the Metrology recipe setup for new process change, advanced tool qualification and Engineering evaluations.
Be responsible for NPI (New Product Introduction) transfer, defining quality metrics, achieving metrology reliability, and driving CIP activity for vendors.
Continuously collaborate and complete tasks with fab operations/equipment teams to improve quality, reduce costs, shorten cycle times and increase yields. Detailed analysis of next-generation metrology capabilities and coordinated CIP programs.
Deliver reliable and valuable metrology applications to reinforce Micron's technical competitiveness. Standardize BKM, knowledge and way of working to keep the growth of metrology team. Early engage with TD and MCT for innovative tech node introduction.
Expect to actively participate in technical meetings and then synthesize their new opportunities or novel approaches.
Engage with the global network to develop best-known methods (BKM) and maintain alignment between Fab sites.
Education and Experience:
Master's degree in Physics, Photonics, Chemistry, Materials Science, Electrical Engineering, Chemical Engineering or related engineering field is preferred.
Bachelor's degree of Science and Engineering or 3+ year equivalent experience with proven ability in Semiconductor Process will also be considered.
Solid understanding of lithography overlay including overlay model and NZO (Non-zero offset) correction, or the experience with metrology/ inspection operation (SEM, X-ray, Laser or Optical Systems).
Excellent technical development, analytical skills and good verbal and written English communication skills.
Demonstrated combination of flexibility and tenacity in the pursuit of goals and strong problem-solving skills.
Investigate process drift, root cause analysis, data manipulation and correlation with 6 months of proven experience or project management
Learn and apply basic Data Science and Data Manipulation (scripting, coding, or programming, Python, JMP, SQL) with minimum of 6 months experience is plus.